WORKING GROUP ON SURFACE ANALYSIS
Number: 522/8/95
Title: Classification of Scanning Probe Microscopies
Coordinator(s): G.
Friedbacher
Completion Date: 1998
Objective:
Although high resolution imaging of surfaces down
to the atomic level using scanning probe microscopy (SPM) techniques
is a comparatively young field of research, it has gained significant
importance in science and technology. This great potential is documented
in over 1000 relevant publications per year dealing with fundamental
aspects, instrumentation and applications of SPMs. This rapid development
has also led to the situation that many new terms, partially redundant
or conflicting with each other, have been introduced by different authors.
Moreover, since SPMs are becoming a well established part of analytical
laboratories, an evaluation of their potential in comparison to other
techniques is desirable. Although a number of review articles can be
found in literature, they are not covering these aspects in such a systematic
way from that point of view. Therefore the goal of this project is a
classification of SPM techniques along with an evaluation of the most
important techniques from the analytical chemist's perspective.
Progress:
Project Completed - Report reference: Pure
Appl. Chem.
71(7), 1337-1357, 1999.
Last Update: 15 october 1999
